Micrometer-gage.



No. 664,l20. Patented Dec. 18, 1900.

A. A. BRANDT.

MICROMETER GAGE.

(Application flied Jan. 16, 1900.) (No Model.) 2 ShaetsSheet l.

I UIIZ 08 "ELM WITNESSES: INVENTOH W .J/w BY A TTOHNE Y S No. 664,120.. Patented Dec. l8, I900.

1 A. A. BRAND-T.

MICROMETER GAGE.

(Application filed Jan. 16, 1900.) (No Model.) 2 Sheets$heet 2.

W/TNESSES y 4 I //v VEN 70/? A TTORNEYS PATENT FFIGE.

ALBERT A. BRANDT, OF BIRMINGHAM, ENGLAND.

MlCROMETER-GAGE.

SPECIFICATION formingpart of Letters Patent No. 664,120, dated December 18, 1900.

Application filed January 16, 1900 Serial No. 1,635. (No model.)

new and improved micrometer-gage arranged to permit a correcting adjustment in case of deviations in the setting of the micrometer device on a beam and to permit convenient' adjustment of the micrometer device proper in case of wear on the anvil and spindle.

The invention consists of novel features and parts and combinations of the same, as will be fully described hereinafter and then pointed out in the claims.

A practical embodiment of myinvention is represented in the accompanying drawings, forming a part of this specification, in which similar characters of reference indicate corresponding parts in all the views.

Figure 1 is a side elevation of the improvement arranged as a beam micrometer-gage. Fig. 2 is an enlarged side elevation of the micrometer device. Fig. 3 is an enlarged sectional side elevation of the same. Fig. 4 is an enlarged side elevation of the graduated sleeve for the spindle-head. Figs. 5, 6, and 7 are side elevations of the correcting-micrometer adjusted to indicate different correcting measurements. Fig. 8 is a transverse section of the same on the line 8 8 in Fig. 3, and Fig. 9 is a like view of the beam on the line 9 9 in Fig. 1.

The beam A of the micrometer-gage is provided at one end with an angular offset A, carrying a suitable anvil B, and on the beam A is mounted to move longitudinally a slide 0, having a shank O and the micrometer device proper, D, as is plainly illustrated in Fig. 1, the slide 0 being provided with a number of apertures 0 any one of which is adapted to be engaged by a pin E, adapted to pass through one of a series of apertures A formed in the beam A, to lock the slide 0 in position on the beam A.

The micrometer device D is provided with a spindle F in axial alinement with the anvil B, and on the shank C of the slide 0 is formed or secured a barrel G, formed with an internal thread G, on which screws an externallythreaded cylinder H, forming part of a sleeve H, extending over the barrel G, as is plainly indicated in Fig. 3, it being understood that the cylinder H and the sleeve H are concentric and are connected with each other by a cylinder-head H having an internal thread H in which screws the outer threaded portion F of the spindle F. The sleeve H is provided with the usual graduated end for indicating micrometer adjustment relatively to the barrel G, as is plainly shown in Figs. 1 and 2. Thus in using the micrometer device D the sleeve H is turned to cause its cylinder H to screw in or out in the barrel G, according to the direction in which the sleeve is turned, and as the sleeve carries the spindle F it is evident that the latter is moved longitudinally in the shank O to change the distance between the anvil and the end of the spindle according to the desired measurement.

On the micrometer device Dis arranged a correcting-micrometer for adjusting the spindle F in a longitudinal direction when the latter is in an innermost zero position, and the slide 0 is secured to the beam A by the pin E engaging registering apertures O and A The correcting micrometer-gage is arranged on the outer end of the spindle F and the outer end of the sleeve H, as is plainly illustrated in the drawings, and said device is for this purpose provided with a head F on the outer end of the spindle F to fit into a correspondingly-shaped recess H in the head H of the sleeve II. On the head F is adj ustably held a sleeve I, formed at its inner end with split portions 1, (see Figs. 4 and 8,) and on said sleeve I is formed a circular zeroline J and an axial zero-line J, intersecting the circular zero-line J at the zero-point. Besides the zero-line J are subdivisional axial lines J and subdivisional circular zero-lines J at the right and left of the line J. The graduations thus produced by the several sets of lines at the left of the circular zeroline J are indicated by a plus sign, While those at the right of said line are indicated by a minus sign. The subdivisions formed by the graduations referred to indicate one one-thousandth, so that the correcting micrometer device can be utilized to adjust the spindle F relatively to the barrel G and slide 0 to one one-thousandth of an inch in either direction, as hereinafter more fully described.

The sleeve I is adapted to be locked in place on the head F by a jam-nut K, and in the said head F are fitted to slide obliquelydisposed pins L, adapted to engage with their outer ends the split portions I of the sleeve I, so as to press the said split portions against the inner wall of the recess H to lock the head F to the head H and consequently to prevent the spindle F from accidentally screwing in the sleeve H. The pins L are adapted to be pushed in an outward direction by a screw-rod N, having a bevel N abutting against the inner ends of the pins L, the screw-rod having its inner threaded portion N screwing in the spindle F. When the screw-rod N is turned to screw inwardly relatively to the spindle F, then the bevelN forces the pins L outward against the split portions 1 of the sleeve I, whereby the said split portions are forced in firm clamping contact with the head H to lock the two heads F and H. together. When the screw-rod N is screwed outward, then the resiliency of the split portions I causes the latter to move out of engagement with the head H to permit the operator to turn the sleeve Land with it the head F and spindle F, so as to screw the same in or outin the head H and sleeve H until the desired correctingadjustment is made. This correcting micrometerdevice is necessary for correcting any inaccuracies in the distances between the anvil B and theinnerend of the spindle, when the slide 0 is secured to the beam A by the pin E engaging the registering apertures C and A It is evident that when the apertures A are laid off inaccurately on the beam A and the slide 0 is secured to the beam at one of the said inaccurate apertures then the distance between the anvil B and the spindle F is inaccurate when the spindle is in zero position, and in order to overcome this inaccuracy it is necessary to adjust the spindle F according to the discrepancy. As is well known, the apertures A are laid off relatively to the anvil B, and the inaccuracy in boring said apertures is marked off on a strip 0, attached to the beam A adjacent to the apertures, as is plainly indicated in Fig. 1.

In the case in hand the apertures A are placed three inches apart, the apertures 0 being spaced one inch apart on the slide C, so that the latter can be secured to the beam Aat each inch, and on each inch-mark formed on the strip 0 is indicated the discrepancy or inaccuracy, either plus 'or minus. If the right-hand aperture 0 on the slide 0 registers with the first aperture A on the beam A, then the rectangular aperture C on the slide 0 is over the one-inch mark on the strip 0. The measuring capacity of the micrometer in this position of the parts is one inch, and the desired measurementis made by turncordingly. As shown in Fig. 1, the slide C stands at the six-inch position, the distance between the anvil and the spindle F being five inches with the sleeve II in zero position. It is understood that in all adjustments of the slide 0 on the beam A the distance between the anvil and the spindle F is one inch less than the amount that appears in the aperture C with the sleeve II in zero position. Now in the instrument shown in Fig. 1 no discrepancy exists at the one-inch mark of strip 0; but for the two-inch mark a plus discrepancy exists of .0025 of an inch-that is to say, when the middle aperture on the slide 0 registers with the aperture A and the pin E is inserted and the spindle F is at zero position then the distance between the anvil B and said spindle F is 0.9975 of an inch, and consequently the spindle F has to be adjusted to add to the distance by .0025 of an inch. This is done by the operator unlocking the pins L by unscrewing the screw-rod N outward and then turning the sleeve I, and with it the head F and the spindle F, until a micrometer reading .0025 is obtained on the line H on the head H and on the plus side of the zeroline J. If the left aperture C is in register with the first opening A and the pin E is inserted in said registering apertures, then the distance between the anvil B and the spindle F when at zero position should be two inches; but as the graduation on the strip 0 indicates minus .0012 at the three-inch mark it is evident that the correcting micrometer device has to be employed to adjust the spindle F correspondinglythat is, itis screwed inward by turning the head F until a reading is obtained on the minus side of the line J and relatively to the line H" to correspond to minus .0012 of an inch. (See Fig. 7.) It is understood that after the adjustment has been made by the correcting micrometer device the spindle F is again locked in place on the sleeve H, and the micrometer-gage is then used in the usual manner.

The graduation on the sleeve I serves the further purpose of permitting a ready adjustment of the spindle F in case it is necessary to compensate for wear on the measuring-faces of the anvil B and the spindle F. This is effected in the following way: If the faces are worn, the sleeve I is unlocked by the jam-n ut K, and then the sleeve is screwed outward on the head F a distance corresponding to the amount of wear which had been previously determined and which amount is readily indicated by following the micrometer reading on the sleeve I. The latter is then again locked in position by the jam-nut K. The spindle F has now to be screwed farther the same distance into the cylinder H to bring the zero-point of the cylinder I to zero position on the line H whereby the wear is taken up, it being understood that the thread F has the same pitch as the measuring-threads G. The compensation for the ing the sleeve H to move the spindle F aci wear on the measuring-thread is obtained by a nut P, screwing in the outer end of the barrel G and on the measuring-th read. The outside thread of the nut P is of a finer pitch than that of the inside thread. For instance, the inside is forty pitch and the outside fortyeightpiteh. Nowifthenutisslightlyscrewed it will, on account of its larger inside pitch, force the cylinder H, and with it the sleeve H, in the opposite direction against the thread G, thus taking up the wear. The nut P can also be made with a coarser thread outside and a finer thread inside,the compensating action then being the same as above described, only in a reversed order.

Having thus fully described my invention, I claim as new and desire to secure by Letters Patent 1. In a micrometer-gage, the combination with a beam, of a main micrometer device movable on the beam and adapted to be fastened thereto at measured points, the said micrometer device comprising a barrel, a cylinder adjustable in the barrel, a sleeve connected with the cylinder and extending over the barrel and a spindle carried by the cylinder, the said sleeve having a graduated end to indicate micrometer adjustment relatively to the barrel and a correcting micrometer device indicating on the other end of said sleeve, to adjust the spindle of the main micrometer device to any discrepancy in the setting of the main micrometer device on the said beam, substantially as shown and described.

2. In a micrometer-gage, the combination with a rigid beam carrying an anvil, of a main micrometer device having a slide movable longitudinally on said beam and adapted to be fastened thereto at measured unit distances from the anvil, the said main micrometer device comprising a barrel, a cylinder screwing in the barrel, a sleeve connected with the cylinder and extending over the barrel, and a spindle carried by the cylinder, the said sleeve being provided with a graduated end to indicate micrometer adjustment relati vely to the barrel, and a correcting micrometer device carried by the main micrometer device and indicating on the other end of said sleeve to correct the spindle of the latter to any discrepancy in the setting of the said slide on the beam, substantially as shown and described.

3. In a micrometer-gage, the combination with a rigid beam carrying an anvil, and having a series of graduated or unit holes, of a main micrometer device provided with a slide movable longitudinally on said beam, the said micrometer device having a barrel, a cylinder adjustable in the barrel, a sleeve eonneeted with the cylinder and extending over the barrel, and a spindle carried by the cylinder and adjustable therein, a pin for fastening the slide in place on the beam at any one of the said graduated or unit holes, and a correcting micrometer device carried by the said main micrometer device for mierometrieally adjusting the spindle of the latter to correct any discrepancy in the setting of the slide on the beam, substantially as shown and described.

4. A micrometer-gage having a main micrometer device comprising a barrel, a cylinder screwing in the barrel and provided with a sleeve extending over the barrel, a spindle carried by said cylinder and movable in and out therewith as the sleeve is turned, the said spindle being adjustable in the cylinder, and a correcting micrometer device carried by the main micrometer device and indicating on the sleeve for mierometrieally adjusting the spindle of said main micrometer device relatively to the sleeve, substantially as described.

5. Amicrometer-gagecomprisingaspindle, a cylinder in which the spindle is adjustable, a barrel in which the cylinder is adjustable, a sleeve movable with the cylinder for mierometrieally adjusting the spindle and having a graduated end, a head at the other end of the sleeve and provided with a recess and a graduated head on said spindle adapted to fit in said recess, the said head indicating on the end of the sleeve to mierometrieally adjust the spindle relatively to the sleeve, substantially as shown and described.

6. A micrometer-gage having a spindle, a cylinder in which the spindle is'adjustable, a barrel in which the cylinder screws, a sleeve for mierometrieally moving the spindle and having a graduated end, a recess at the other end of the sleeve a graduated head on said spindle adapted to fit in said recess and indieating on the end of said sleeve to mierometrieally adjust the spindle relative to the sleeve, and means for locking the head of the spindle to the said end of the sleeve, substantially as described.

7. A micrometer gage having a spindle formed with a threaded portion, a cylinder in which the spindle screws, a barrel in which the cylinder is adjustable, a sleeve extending over the barrel and having a graduated end for indicating micrometer adjustment relatively to the barrel, the other end of said sleeve being connected with the cylinder by a head, and a nut screwing in the outer end of the barrel and on the cylinder adjacent to the head for the purpose set forth.

8. A micrometer-gage having a spindle, a sleeve for mierometrieally moving the spindle, the latter being adjustable in the sleeve, a graduated head on said spindle and indicating on the sleeve,to mierometrieally adjust the spindle relatively to the sleeve, and means for locking the spindle to the said sleeve, the said means comprising a split sleeve on the head, pins in the head for pressing the split portions against the said spindle-sleeve, and means for forcing the pins outward against the split portions, substantially as shown and described.

9. A micrometer-gage having a spindle, a sleeve for mierometrieally moving the spindle, the said sleeve having a head at its outer end, a head on said spindle adapted to fit into a recess in the head of the sleeve, a graduated sleeve adjustably held on the spindle-head, and indicating on the spindle-sleeve, a nut on the outer end of the spindle-head for looking the graduated sleeve in place on the spindle-head, the said graduated sleeve being formed at its inner end with split portions, obliquely-disposed pins fitted to slide in the spindle head and adapted to engage with theirouter ends the split portions of the sleeve to press the same against the inner wall of the recess in the head of the spindle-sleeve, to lock the spindle-head to the head of the spindle-sleeve, and a screw-rod having an inner threaded portion screwing into the spindle and a bevel portion engaging the inner ends of the pins to force the pins outward, substantially as described.

10. A micrometer-gage having a spindle, a sleeve for micrometrically moving the spindle, the latter being adjustable in the sleeve, the said sleeve having a head at its outer end in which the said spindle screws, a head on the outer end of said spindle and arranged to fit in a correspondiugly-shaped recess in the head of the spindle-sleeve, a graduated sleeve adjustably held on the said spindle-head and indicating on the spindle-sleeve and means for locking the spindle-head to the head of the sleeve, substantially as described.

11. A micrometer-gage comprising a beam provided with an anvil, a slide mounted on said beam, a barrel carried by the slide and having an internal thread, a cylinder screwing in the said barrel, a sleeve having a head at one end connected with the cylinder, the said sleeve extending over the barrel and having its end graduated, a spindle screwing in the cylinder-head and in axial alinement with the anvil, and a correcting micrometer device for adjusting the spindle of the main micrometer device, substantially as described.

12. In a micrometer-gage, the combination with a beam, provided with an anvil, of a main micrometer device comprising a slide mounted to move longitudinally on said beam and having a shank, a barrel carried by said shank and formed with an internal thread, an externally-threaded cylinder screwing in the said barrel, a sleeve concentric with the said cylinder and extending over the said barrel, the said sleeve and cylinder being connected with each other by a cylinder-head having an internal thread,- a spindle having an outer threaded portion screwing in the cylinderhead, the said spindle being in axial alinemcut with the anvil, the said sleeve having a graduated end for indicating micrometer adjustment relative to the barrel, and a correcting micrometer device for adjusting the spindle of the main micrometer device, substantially as described.

In testimony whereof I have signed my name to this specification in the presence of two subscribing witnesses.

ALBERT A. BRANDT.

\Vitnesses:

J OHN B. ALLESTER, KARL H. KOHLHAAS. 

